000 01081nam a2200289Ia 4500
999 _c7265
_d7265
003 OCoLC
005 20201127123510.0
007 cr unu
008 130920s2010 njua sb 001 0 eng d
020 _z978-0-470-27800-0
040 _aDDC
_cDDC
_bEnglish
_dTSSD
082 _a621.367 PAS
100 1 _aPastorino, Matteo
245 1 0 _aMicrowave imaging
_hElectronic resource /
_cMatteo Pastorino
260 _aHoboken :
_bJ. Wiley & Sons,
_cc2010
300 _aviii, 285p. :
_bill.;
490 1 _aWiley series in microwave and optical engineering
504 _aIncludes bibliographical references and index
650 0 _aMicrowave imaging
_xIndustrial applications
650 0 _aNondestructive testing
650 0 _aRadiography, Industrial
655 0 _aElectronic books
710 2 _aOhio Library and Information Network
776 0 8 _iPrint version:
_aPastorino, Matteo.
_tMicrowave imaging.
_dHoboken, N.J. : John Wiley, c2010
_z9780470278000
_w(DLC) 2009041788
_w(OCoLC)303076651
830 0 _aWiley series in microwave and optical engineering
942 _2ddc
_cBOOK